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- contact and lateral microscopy modes; mode of the resonance and modulation microscopy; possibility of the registering of the module, the amplitude projections on the vector of the signal excitated the oscillation; possibility of the registering and support of the oscillation phase; possibility of the registering of the fractional harmonics with the highest frequency up to 1.8 MHz; - magnetoforce mode and the mode of the registering of the electrical forces; current mode with the simultaneously registering of the surface topographical characteristics; adhesive mode; - thermomode with the possibility to measure of the thermal fields around on the object surface with the nanometer spatial resolution and relative resolution according to temperature up to 0.02°C in a temperature range - 40°C + 140°C; - nanolitography unit mode with a possibility of an implementaion of the modulation tensoinduced modification of the surface. |