R. V. Lapshin is a member of the Russian Society of Scanning Probe Microscopy and Nanotechnology, a referee of the journals Review of Scientific Instruments, Measurement Science and Technology, Nanotechnology, IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, an expert of the Russian Corporation of Nanotechnologies

Professional employment
Education
Articles
Reports
Patents
Grants
Ph. D. thesis
Contact information

Professional employment

• 1996 – present, staff scientist of the Institute of Physical Problems named after F. V. Lukin, Zelenograd
• 1990 – 1996, researcher of “Delta” Microelectronics and Nanotechnology Research Institute, Moscow
• 1988 – 1989, engineer of the Moscow State Technical University named after N. E. Bauman, Moscow

Education

• 1990 – 1993, postgraduate of “Scientific Center” Advanced Research Enterprise, Zelenograd
• 1984 – 1990, student of the Moscow State Technical University named after N. E. Bauman, faculty of Radio Electronics and Lasers, Moscow

Articles

1. R. V. Lapshin, “Feature-oriented scanning probe microscopy”, Encyclopedia of Nanoscience and Nanotechnology, Edited by H. S. Nalwa, American Scientific Publishers, chapter 269, 2010.
2. R. V. Lapshin, A. P. Alekhin, A. G. Kirilenko, S. L. Odintsov, V. A. Krotkov, “Vacuum ultraviolet smoothing of nanometer-scale asperities of poly(methyl methacrylate) surface”, Journal of Surface. Roentgen, Synchrotron and Neutron Studies, number 1, pages 5-16, 2010 (in Russian); R. V. Lapshin, A. P. Alekhin, A. G. Kirilenko, S. L. Odintsov, V. A. Krotkov, “Vacuum ultraviolet smoothing of nanometer-scale asperities of poly(methyl methacrylate) surface”, Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, volume 4, number 1, pages 1-11, 2010.
3. R. V. Lapshin, “Availability of feature-oriented scanning probe microscopy for remote-controlled measurements on board a space laboratory or planet exploration rover”, Astrobiology, volume 9, number 5, pages 437-442, 2009.
4. R. V. Lapshin, “Method for automatic correction of drift-distorted SPM-images”, Journal of Surface. Roentgen, Synchrotron and Neutron Studies, number 11, pages 13-20, 2007 (in Russian); R. V. Lapshin, “A method for automatic correction of drift-distorted SPM images”, Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, volume 1, number 6, pages 630-636, 2007.
5. R. V. Lapshin, “Automatic drift elimination in probe microscope images based on techniques of counter-scanning and topography feature recognition”, Measurement Science and Technology, volume 18, issue 3, pages 907-927, 2007.
6. A. P. Alekhin, A. G. Kirilenko, A. I. Kozlitin, R. V. Lapshin, S. N. Mazurenko, “Hydrophobic-hydrophilic nanostructure synthesis on polymer surfaces in low-temperature carbon plasma”, Journal of Surface. Roentgen, Synchrotron and Neutron Studies, number 11, pages 8-11, 2006 (in Russian).
7. R. V. Lapshin, “Automatic distributed calibration of probe microscope scanner”, Journal of Surface. Roentgen, Synchrotron and Neutron Studies, number 11, pages 69-73, 2006 (in Russian).
8. R. V. Lapshin, “Feature-oriented scanning methodology for probe microscopy and nanotechnology”, Nanotechnology, volume 15, issue 9, pages 1135-1151, 2004.
9. A. P. Alekhin, A. G. Kirilenko, R. V. Lapshin, “Surface morphology of thin carbon films deposited from plasma on polyethylene with low density”, Journal of Surface. Roentgen, Synchrotron and Neutron Studies, number 2, pages 3-9, 2004 (in Russian).
10. A. P. Alekhin, A. G. Kirilenko, R. V. Lapshin, R. I. Romanov, A. A. Sigarev, “Investigation of nanostructured carbon coating on polyethylene as a substrate”, Journal of Applied Chemistry, volume 76, number 9, pages 1536-1540, 2003 (in Russian); A. P. Alekhin, A. G. Kirilenko, R. V. Lapshin, R. I. Romanov, A. A. Sigarev, “Nanostructured carbon coatings on polyethylene films”, Russian Journal of Applied Chemistry, volume 76, number 9, pages 1497-1501, 2003.
11. R. V. Lapshin, “Digital data readback for a probe storage device”, Review of Scientific Instruments, volume 71, number 12, pages 4607-4610, 2000.
12. R. V. Lapshin, “Automatic lateral calibration of tunneling microscope scanners”, Review of Scientific Instruments, volume 69, number 9, pages 3268-3276, 1998.
13. R. V. Lapshin, V. N. Ryabokony, A. V. Denisov, “Measurement of spatial characteristics of ordered surface nanostructures with scanning tunneling microscope”, Proceedings of the Second International Scientific and Technical Conference “Microelectronics and Informatics”, part 2, pages 349-357, Zelenograd, Moscow, Russian Federation, 1997 (in Russian).
14. R. V. Lapshin, “Analytical model for the approximation of hysteresis loop and its application to the scanning tunneling microscope”, Review of Scientific Instruments, volume 66, number 9, pages 4718-4730, 1995 (Russian translation is available).
15. R. V. Lapshin, “Hysteresis compensation model for STM scanning unit”, Proceedings of the Second International Conference on Nanometer-Scale Science and Technology (NANO-II), Herald of Russian Academy of Technological Sciences, volume 1, number 7, part B, pages 511-529, Moscow, Russia, 1994.
16. R. V. Lapshin, O. V. Obyedkov, “Fast-acting piezoactuator and digital feedback loop for scanning tunneling microscopes”, Review of Scientific Instruments, volume 64, number 10, pages 2883-2887, 1993.

Reports

1. R. V. Lapshin, P. V. Azanov, E. A. Ilyichev, G. N. Petruhin, L. L. Kupchenko, “Formation of catalytic Ni-nanoparticles in glow-discharge Ar-plasma for low temperature synthesis of carbon nanostructures”, XIV International Symposium “Nanophysics and Nanoelectronics”, volume 2, pages 563-564, Nizhni Novgorod, Russian Federation, March 15-19, 2010 (in Russian).
2. R. V. Lapshin, A. P. Alekhin, A. G. Kirilenko, S. L. Odintsov, V. A. Krotkov, “Smoothing of nanoasperities of poly(methyl methacrylate) film by vacuum ultraviolet”, XIII International Symposium “Nanophysics and Nanoelectronics”, volume 1, pages 280-281, Nizhni Novgorod, Russian Federation, March 16-20, 2009 (in Russian).
3. R. V. Lapshin, “Automatic distributed calibration of probe microscope scanner”, Symposium “Nanophysics and Nanoelectronics”, volume 1, pages 161-162, Nizhni Novgorod, Russian Federation, March 25-29, 2005 (in Russian).
4. R. V. Lapshin, “Method for automatic correction of drift-distorted SPM-images”, Symposium “Nanophysics and Nanoelectronics”, volume 1, pages 159-160, Nizhni Novgorod, Russian Federation, March 25-29, 2005 (in Russian).
5. S. A. Gavrilov, V. M. Roschin, A. V. Zheleznyakova, S. V. Lemeshko, B. N. Medvedev, R. V. Lapshin, E. A. Poltoratsky, G. S. Rychkov, N. N. Dzbanovsky, N. N. Suetin, “AFM investigation of highly ordered nanorelief formation by anodic treatment of aluminum surface”, Physics, Chemistry and Application of Nanostructures: Reviews and Short Notes to Nanomeeting 2003 (International Conference “Nanomeeting-2003”, Minsk, Belarus, May 20-23, 2003), Edited by V. E. Borisenko, S. V. Gaponenko, V. S. Gurin, World Scientific Publishing Ltd., London, UK, pages 500-502, 2003.
6. R. V. Lapshin, “Feature-oriented scanning for spacecraft-borne remote SPM-investigations”, Workshop on Micro-Nano Technology for Aerospace Applications, Montreal, Canada, August 25-30, 2002.
7. A. P. Alekhin, A. G. Kirilenko, R. V. Lapshin, A. A. Sigarev, “AFM studies of the morphology of the carbon layers deposited on medical low-density polyethylene films by the method of pulsed plasma-arc sputtering of graphite”, Abstracts of the International Conference on Nanotechnology and MEMS (IR04), Galway, Ireland, 2002.
8. S. A. Gavrilov, A. V. Emelyanov, E. A. Ilyichev, R. V. Lapshin, V. M. Roschin, “Fabrication technique and characteristic investigation of field-controlled nanotransistors”, All-Russian Scientific and Technical Conference “Micro- and Nano-electronics 2001”, volume 2, page P1-1, Zvenigorod, Moscow, Russian Federation, 2001 (in Russian).
9. R. V. Lapshin, “Digital data readback method for a probe storage device”, The Third International Scientific and Technical Conference “Electronics and Informatics – XXI Century”, pages 169-170, Zelenograd, Moscow, Russian Federation, November 22-24, 2000 (in Russian).
10. R. V. Lapshin, “Probe positioning of scanning microscope-nanolithograph by local surface features”, The Third International Scientific and Technical Conference “Electronics and Informatics – XXI Century”, pages 167-168, Zelenograd, Moscow, Russian Federation, November 22-24, 2000 (in Russian).
11. R. V. Lapshin, “Correction of drift-distorted SPM-images”, The Third International Scientific and Technical Conference “Electronics and Informatics – XXI Century”, pages 76-77, Zelenograd, Moscow, Russian Federation, November 22-24, 2000 (in Russian).
12. R. V. Lapshin, “Procedure for atom recognition in STM-images”, The Third International Scientific and Technical Conference “Microelectronics and Informatics”, pages 222-223, Zelenograd, Moscow, Russian Federation, November 11-12, 1997 (in Russian).
13. S. A. Gavrilov, A. V. Emelyanov, R. V. Lapshin, V. N. Ryabokony, O. I. Chegnova, “Electrochemical nanometer-scale structuring of silicon surface”, The Third International Scientific and Technical Conference “Microelectronics and Informatics”, pages 155-156, Zelenograd, Moscow, Russian Federation, November 11-12, 1997 (in Russian).
14. R. V. Lapshin, V. N. Ryabokon, A. V. Denisov, “Scanning tunneling microscope measurements of the spatial characteristics of ordered surface nanostructures”, The Fourth International Conference on Nanometer-Scale Science and Technology (NANO-IV), Beijing, P. R. China, September 8-12, 1996.
15. A. V. Denisov, R. V. Lapshin, V. N. Ryabokony, “Measurement technique of ordered self-assembly nanometer-sized structures with tunneling microscopy”, The Second International Scientific and Technical Conference “Microelectronics and Informatics”, pages 159-160, Zelenograd, Moscow, Russian Federation, November 23-24, 1995 (in Russian).
16. R. V. Lapshin, “Hysteresis compensation model for STM scanning unit”, The Second International Conference on Nanometer-Scale Science and Technology (NANO-II), August 2-6, Moscow, Russia, 1993.

Patents

1. R. V. Lapshin, “Method of correction of surface images obtained using scanning probe microscope and distorted with drift”, Patent of Russian Federation, no. 2,326,367, July 27, 2006.
2. R. V. Lapshin, “Method of automatic distributed calibration of probe microscope scanner”, Patent of Russian Federation, no. 2,295,783, January 25, 2005.
3. R. V. Lapshin, “Procedure of movement of sonde of scanning microscope-nanolithograph in field of coarse X-Y positioner”, Patent of Russian Federation, no. 2,181,212, September 7, 1999.
4. R. V. Lapshin, “Method for measuring surface relief by means of scanning probe type microscope”, Patent of Russian Federation, no. 2,175,761, June 8, 1999.
5. R. V. Lapshin, “Method for reading digital information in probe memory device”, Patent of Russian Federation, no. 2,181,218, November 2, 1998.

Grants

1. A. P. Alekhin, K. S. Esenkin, A. G. Kirilenko, V. A. Krotkov, R. V. Lapshin, B. K. Medvedev, K. A. Tsarik, “Synthesis and investigation of mesoscopic-scaled carbon nanostructures to form surfaces with biocompatible properties”, Russian Foundation for Basic Research, no. 05-03-32394, 2005-2007.
2. B. K. Medvedev, R. V. Lapshin, “Application of algorithms and information methods for data readback in petabit capacity probe storage device”, Russian Foundation for Basic Research, no. 05-01-00407, 2005.
3. A. P. Alekhin, A. G. Kirilenko, V. A. Krotkov, R. V. Lapshin, “Development of low-temperature synchrotron radiation stimulated processes forming surface structures applicable to medicine”, Moscow Committee on Science and Technologies, no. 42-T/03, 2003-2004.
4. A. P. Alekhin, D. A. Byalko, A. G. Kirilenko, V. A. Krotkov, R. V. Lapshin, S. N. Mazurenko, R. I. Romanov, “Investigation of physical-chemical peculiarities of radiation-stimulated modification of surfaces of crystalline and noncrystalline solids aimed to form specific properties of the solids”, Russian Foundation for Basic Research, no. 02-03-32615, 2002-2004.
5. A. P. Alekhin, A. G. Kirilenko, V. A. Krotkov, R. V. Lapshin, “Nanotechnology development of polymer surface modification for medicine materials and manufactures”, Moscow Committee on Science and Technologies, no. GA-74/01, 2001.
6. A. P. Alekhin, A. E. Bochkanov, R. V. Lapshin, A. M. Markeev, O. I. Naumenko, R. I. Romanov, “Investigation of synchrotron light source induced chemisorption processes on semiconductor surfaces during synthesizing multilayer microstructures”, Russian Foundation for Basic Research, no. 98-02-17259, 1998-2000.
7. V. N. Ryabokony, S. A. Gavrilov, A. V. Emelyanov, R. V. Lapshin, O. I. Chegnova, “Regular patterning of nanometer-sized metal layer on solid body surface: simulation, formation mechanisms, application to nanoelectronics”, Russian Foundation for Basic Research, no. 96-02-17870, 1996-1998.
8. V. N. Ryabokony, A. V. Emelyanov, R. V. Lapshin, Grant from the “Fund of Physics of Solid Nanostructures”, Ministry of Science and Technologies, no. 96-2012, 1996.

Ph. D. thesis

• R. V. Lapshin, “Object-oriented scanning for probe microscopy and nanotechnology”, Ph. D. abstract, Institute of Physical Problems named after F. V. Lukin, Moscow, 2002 (in Russian).
• R. V. Lapshin, “Object-oriented scanning for probe microscopy and nanotechnology”, Ph. D. thesis, Institute of Physical Problems named after F. V. Lukin, Moscow, 2002 (in Russian).

Contact information:

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